Penerapan Data Mining Untuk Mendeteksi Kerusakan Laptop

Data

http://mfahri.web.id/open-data-contoh-kerusakan-laptop/

Algoritma

Naive Bayes

Hasil

Distribution model for label attribute Kerusakan
Class IC Power Rusak (0.278)
6 distributions
Class Embeded Controller Rusak (0.151)
6 distributions
Class IC Charger Rusak (0.155)
6 distributions
Class Kapasitor Rusak (0.141)
6 distributions
Class Resistor Rusak (0.165)
6 distributions
Class Mofset Rusak (0.110)
6 distributions

Evaluasi Algoritma

PerformanceVector:
accuracy: 84.18% +/- 5.18% (mikro: 84.19%)
ConfusionMatrix:
True: IC Power Rusak Embeded Controller Rusak IC Charger Rusak Kapasitor Rusak Resistor Rusak Mofset Rusak
IC Power Rusak: 41 0 0 2 0 0
Embeded Controller Rusak: 0 40 0 0 0 0
IC Charger Rusak: 0 4 45 0 0 0
Kapasitor Rusak: 7 0 0 39 0 0
Resistor Rusak: 33 0 0 0 48 0
Mofset Rusak: 0 0 0 0 0 32
kappa: 0.810 +/- 0.061 (mikro: 0.810)
ConfusionMatrix:
True: IC Power Rusak Embeded Controller Rusak IC Charger Rusak Kapasitor Rusak Resistor Rusak Mofset Rusak
IC Power Rusak: 41 0 0 2 0 0
Embeded Controller Rusak: 0 40 0 0 0 0
IC Charger Rusak: 0 4 45 0 0 0
Kapasitor Rusak: 7 0 0 39 0 0
Resistor Rusak: 33 0 0 0 48 0
Mofset Rusak: 0 0 0 0 0 32